secondary contact

A time-of-flight secondary ion mass spectrometer ( TOF-SIMS), X-ray photoelectron spectroscopy ( XPS), an atomic force microscopy ( AFM), and contact angle measurements were used to characterize the monolayer.

使用时间飞行二次离子质谱仪（TOF-SIMS）、X射线光电子能谱仪（XPS）、原子力显微镜（AFM）和接触角测量仪对FTE自组装膜进行了表征。

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Secondary school students in contact with our network, how to control yourself?

我们的中学生在接触网络时, 该如何把持自己 呢 ?

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The FTE SAMs was characterized by the time-of-flight secondary ion mass spectrometer ( TOF-SIMS), atomic force microscopy ( AFM) and contact angle measurement, and the tribology properties of the FTE SAMs were measured by the Olympus head/ disk interface reliability measurement system.

应用时间飞行二次离子质谱仪（TOF-SIMS）、原子力显微镜（AFM）和接触角测量仪对FTE自组装膜进行表征。通过Olympus磁头磁盘界面可靠性测试系统对FTE自组装膜的摩擦学性能进行研究。

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By means of numerical simulation and in-situ test, this article research on distribution rule of surrounding rock pressure and contact pressure and safety evaluation and design optimization of secondary linings.

本文通过现场试验并结合数值模拟研究的方法，对围岩压力和接触压力的分布规律以及二次衬砌安全性评价和优化设计作了初探。

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Test plate method belongs to contact-type detection, is easy to cause secondary damage of the surface shape. Interferometer method belongs to non-contact, but it usually detects single-chip and costly.

样板法属于接触性检验，容易对面形造成二次损伤；干涉仪法属于非接触法，但干涉仪造价昂贵，而且通常只能对单个镜片进行检验。

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